SRF2013 - List of Keywords (network)

Paper	Title	Other Keywords	Page
TUP070	Characterization of Superconducting Samples With SIC System for Thin Film Developments: Status and Recent Results.	niobium, cavity, ECR, SRF	599
	G.V. Eremeev, H.L. Phillips, A-M. Valente-Feliciano JLAB, Newport News, Virginia, USA C.E. Reece JLab, Newport News, Virginia, USA B. P. Xiao BNL, Upton, Long Island, New York, USA
	Funding: Work supported by DOE. Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. Within any thin film development program directed towards SRF accelerating structures, there is a need for an RF characterization device that can provide information about RF properties of small samples. The current installation of the RF characterization device at Jefferson Lab is Surface Impedance Characterization (SIC) system. The data acquisition environment for the system has recently been improved to allow for automated quicker measurement, and the system has been routinely used for characterization of bulk Nb, films of Nb on Cu, MgB2, NbTiN, Nb3Sn films, etc. We present some of the recent results that illustrate present capabilities and limitations of the system.

Paper

Title

Other Keywords

Page

TUP070

Characterization of Superconducting Samples With SIC System for Thin Film Developments: Status and Recent Results.

niobium, cavity, ECR, SRF

599

G.V. Eremeev, H.L. Phillips, A-M. Valente-Feliciano
JLAB, Newport News, Virginia, USA
C.E. Reece
JLab, Newport News, Virginia, USA
B. P. Xiao
BNL, Upton, Long Island, New York, USA

Funding: Work supported by DOE. Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
Within any thin film development program directed towards SRF accelerating structures, there is a need for an RF characterization device that can provide information about RF properties of small samples. The current installation of the RF characterization device at Jefferson Lab is Surface Impedance Characterization (SIC) system. The data acquisition environment for the system has recently been improved to allow for automated quicker measurement, and the system has been routinely used for characterization of bulk Nb, films of Nb on Cu, MgB2, NbTiN, Nb3Sn films, etc. We present some of the recent results that illustrate present capabilities and limitations of the system.