SRF2013 - List of Keywords (ECR)

Paper	Title	Other Keywords	Page
TUP070	Characterization of Superconducting Samples With SIC System for Thin Film Developments: Status and Recent Results.	niobium, cavity, SRF, network	599
	G.V. Eremeev, H.L. Phillips, A-M. Valente-Feliciano JLAB, Newport News, Virginia, USA C.E. Reece JLab, Newport News, Virginia, USA B. P. Xiao BNL, Upton, Long Island, New York, USA
	Funding: Work supported by DOE. Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. Within any thin film development program directed towards SRF accelerating structures, there is a need for an RF characterization device that can provide information about RF properties of small samples. The current installation of the RF characterization device at Jefferson Lab is Surface Impedance Characterization (SIC) system. The data acquisition environment for the system has recently been improved to allow for automated quicker measurement, and the system has been routinely used for characterization of bulk Nb, films of Nb on Cu, MgB2, NbTiN, Nb3Sn films, etc. We present some of the recent results that illustrate present capabilities and limitations of the system.

TUP079	ECR Nb Films Grown on Amorphous and Crystalline Cu Substrates: Influence of Ion Energy	ion, SRF, interface, electron	631
	A-M. Valente-Feliciano, G.V. Eremeev, H.L. Phillips, C.E. Reece JLAB, Newport News, Virginia, USA C. Cao Illinois Institute of Technology, Chicago, IL, USA Th. Proslier ANL, Argonne, USA J.K. Spradlin JLab, Newport News, Virginia, USA T. Tao UIC, Chicago, USA
	Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. In the pursuit of niobium (Nb) films with similar performance with the commonly used bulk Nb surfaces for Superconducting RF (SRF) applications, significant progress has been made with the development of energetic condensation deposition techniques. Using energetic condensation of ions extracted from plasma generated by Electron Cyclotron Resonance, it has been demonstrated that Nb films with good structural properties and RRR comparable to bulk values can be produced on metallic substrates. The controlled incoming ion energy enables a number of processes such as desorption of adsorbed species, enhanced mobility of surface atoms and sub-implantation of impinging ions, thus producing improved film structures at lower process temperatures. Particular attention is given to the nucleation conditions to create a favorable template for growing the final surface exposed to SRF fields. The influence of the deposition energy for both hetero-epitaxial and fiber growth modes on copper substrates is investigated with the characterization of the film surface, structure, superconducting properties and RF performance.

Paper

Title

Other Keywords

Page

TUP070

Characterization of Superconducting Samples With SIC System for Thin Film Developments: Status and Recent Results.

niobium, cavity, SRF, network

599

G.V. Eremeev, H.L. Phillips, A-M. Valente-Feliciano
JLAB, Newport News, Virginia, USA
C.E. Reece
JLab, Newport News, Virginia, USA
B. P. Xiao
BNL, Upton, Long Island, New York, USA

Funding: Work supported by DOE. Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
Within any thin film development program directed towards SRF accelerating structures, there is a need for an RF characterization device that can provide information about RF properties of small samples. The current installation of the RF characterization device at Jefferson Lab is Surface Impedance Characterization (SIC) system. The data acquisition environment for the system has recently been improved to allow for automated quicker measurement, and the system has been routinely used for characterization of bulk Nb, films of Nb on Cu, MgB2, NbTiN, Nb3Sn films, etc. We present some of the recent results that illustrate present capabilities and limitations of the system.

TUP079

ECR Nb Films Grown on Amorphous and Crystalline Cu Substrates: Influence of Ion Energy

ion, SRF, interface, electron

631

A-M. Valente-Feliciano, G.V. Eremeev, H.L. Phillips, C.E. Reece
JLAB, Newport News, Virginia, USA
C. Cao
Illinois Institute of Technology, Chicago, IL, USA
Th. Proslier
ANL, Argonne, USA
J.K. Spradlin
JLab, Newport News, Virginia, USA
T. Tao
UIC, Chicago, USA

Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
In the pursuit of niobium (Nb) films with similar performance with the commonly used bulk Nb surfaces for Superconducting RF (SRF) applications, significant progress has been made with the development of energetic condensation deposition techniques. Using energetic condensation of ions extracted from plasma generated by Electron Cyclotron Resonance, it has been demonstrated that Nb films with good structural properties and RRR comparable to bulk values can be produced on metallic substrates. The controlled incoming ion energy enables a number of processes such as desorption of adsorbed species, enhanced mobility of surface atoms and sub-implantation of impinging ions, thus producing improved film structures at lower process temperatures. Particular attention is given to the nucleation conditions to create a favorable template for growing the final surface exposed to SRF fields. The influence of the deposition energy for both hetero-epitaxial and fiber growth modes on copper substrates is investigated with the characterization of the film surface, structure, superconducting properties and RF performance.