TY - CONF AU - Hryhorenko, O. AU - Antoine, C.Z. AU - Dohmae, T. AU - Keckert, S. AU - Knobloch, J. AU - Kugeler, O. AU - Longuevergne, D. AU - Proslier, Th. AU - Éozénou, F. ED - Saito, Kenji ED - Xu, Ting ED - Sakamoto, Naruhiko ED - Schaa, Volker R.W. ED - Thomas, Paul W. TI - Recent Advances in Metallographic Polishing for SRF Application J2 - Proc. of SRF2023, Grand Rapids, MI, USA, 25-30 June 2023 CY - Grand Rapids, MI, USA T2 - International Conference on RF Superconductivity T3 - 21 LA - english AB - This talk is an overview of the metallographic polishing R&D program covering Niobium and Copper substrates treatment for thin film coating as an alternative fabrication pathway for 1.3 GHz elliptical cavities. The presented research is the result of a collaborative effort between IJCLab, CEA/Irfu, HZB, and KEK in order to develop innovative surface processing and cavity fabrication protocols capable of meeting stringent requirements for SRF surfaces, including the reduction of safety risks and ecological footprint, enhancing reliability, improving the surface roughness, and potentially allowing cost reduction. The research findings will be disclosed. PB - JACoW Publishing CP - Geneva, Switzerland SP - 646 EP - 650 KW - cavity KW - SRF KW - niobium KW - laser KW - framework DA - 2023/09 PY - 2023 SN - 2673-5504 SN - 978-3-95450-234-9 DO - doi:10.18429/JACoW-SRF2023-WEIXA06 UR - https://jacow.org/srf2023/papers/weixa06.pdf ER - TY - CONF AU - Hryhorenko, O. AU - Antoine, C.Z. AU - Dohmae, T. AU - Longuevergne, D. AU - Valizadeh, R. ED - Saito, Kenji ED - Xu, Ting ED - Sakamoto, Naruhiko ED - Schaa, Volker R.W. ED - Thomas, Paul W. TI - Exploring Innovative Pathway for SRF Cavity Fabrication J2 - Proc. of SRF2023, Grand Rapids, MI, USA, 25-30 June 2023 CY - Grand Rapids, MI, USA T2 - International Conference on RF Superconductivity T3 - 21 LA - english AB - This article shows a study on an alternative pathway for the fabrication of a complete 1.3 GHz SRF cavity, aiming at improving production reliability, reducing the use of chemical polishing (EP or BCP) which is a costly and safety-critical step, and preserving surface quality after forming. Unlike the conventional pathway, the fabrication process is performed after polishing. This point is crucial as the used polishing technology could be applied only to flat geometries. The performed investigation demonstrates that damages during the fabrication process are considered minor, localized, and limited to the near-surface. Moreover, these studies confirm that the damaged layer (100-200 µm) is mainly caused by the rolling process, and not by the subsequent fabrication steps. A laser confocal microscope and SEM-EBSD technique were used to compare samples before and after forming. The preliminary results are discussed and presented in this paper. PB - JACoW Publishing CP - Geneva, Switzerland SP - 680 EP - 684 KW - cavity KW - SRF KW - niobium KW - laser KW - electron DA - 2023/09 PY - 2023 SN - 2673-5504 SN - 978-3-95450-234-9 DO - doi:10.18429/JACoW-SRF2023-WEPWB050 UR - https://jacow.org/srf2023/papers/wepwb050.pdf ER -