<?xml version="1.0" encoding="UTF-8"?>
<xml>
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    <record>
       <contributors>
          <authors>
             <author>Shemelin, V.D.</author>
             <author>Liepe, M.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Measurements of High Values of Dielectric Permittivity Using Transmission Lines
          </title>
       </titles>
       <publisher>JACoW Publishing</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>2673-5504</isbn>
		 <isbn>978-3-95450-234-9</isbn>
		 <electronic-resource-num>10.18429/JACoW-SRF2023-TUPTB026</electronic-resource-num>
		 <language>English</language>
		 <pages>447-451</pages>
       <keywords>
          <keyword>GUI</keyword>
          <keyword>resonance</keyword>
          <keyword>simulation</keyword>
          <keyword>higher-order-mode</keyword>
          <keyword>cavity</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2023</year>
          <pub-dates>
             <date>2023-09</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>https://doi.org/10.18429/JACoW-SRF2023-TUPTB026</url>
              <url>https://jacow.org/srf2023/papers/tuptb026.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          Usage of lossy materials is necessary for absorption of higher order modes excited in the RF cavities. Presently, measurements of lossy materials with usage of transmission lines give errors rapidly increasing with increase of the dielectric permittivity. A method is presented for measurements of high values of dielectric permittivity epsilon in a waveguide at high frequencies with lower errors. This method supplements the method of measurements evolved for low values of epsilon and is close to resonant methods, when a sample is placed into a cavity and the measurement is done at one only frequency. The new approach with use of Microwave Studio simulations makes possible to measure this value in several frequency points at one measurement.
       </abstract>
    </record>
  </records>
</xml>
