Title |
Plasma Electrolytic Polishing Technology Progress Development for Nb and Cu Substrates Preparation |
Authors |
- E. Chyhyrynets, O. Azzolini, R. Caforio, D. Fonnesu, D. Ford, G. Keppel, C. Pira, A. Salmaso, F. Stivanello
INFN/LNL, Legnaro (PD), Italy
- G. Marconato
Università degli Studi di Padova, Padova, Italy
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Abstract |
Superconducting radio frequency (SRF) cavity performance is highly dependent on surface preparation. Conventionally, electropolishing (EP) is used to achieve a clean surface and low roughness for both Nb and Cu substrates, but it requires harsh and corrosive solutions like concentrated acids. Plasma Electrolytic Polishing (PEP) is a promising alternative that uses only diluted salt solutions and has several advantages over EP. PEP can replace intermediate steps like mechanical or chemical polishing, thanks to its superior removal rate of up to 2-8 um/min of Nb and 3-30 um/min of Cu. It achieves Ra roughness of 100 nm for both substrates and has a higher smoothing effect than EP. PEP is also suitable for normal conducting cavities and other accelerator components, including couplers. We demonstrate the effectiveness of PEP on SRF substrates and analyse substrate defect evaluation. We demonstrate the application of PEP onto SRF substrates and analyse the substrate’s defect evaluation. The ongoing work includes Nb bulk and Nb on Cu QPR treatments and RF tests in collaboration with HZB.
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Funding |
Work supported by the INFN CSNV experiment SAMARA. Fundings from the EU’s Horizon 2020 Research and Innovation programme under Grant Agreement N 101004730. PNRR MUR project PE0000023-NQSTI. |
Paper |
download MOPMB009.PDF [0.576 MB / 5 pages] |
Poster |
download MOPMB009_POSTER.PDF [11.877 MB] |
Cite |
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Conference |
SRF2023 |
Series |
International Conference on RF Superconductivity (21st) |
Location |
Grand Rapids, MI, USA |
Date |
25-30 June 2023 |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editorial Board |
Kenji Saito (FRIB, MSU, East Lansing, MI, USA); Ting Xu (FRIB, MSU, East Lansing, MI, USA); Naruhiko Sakamoto (RIKEN, Wako, Japan); Volker R.W. Schaa (GSI, Darmstadt, Germany); Paul W. Thomas (FRIB, MSU, East Lansing, MI, USA) |
Online ISBN |
978-3-95450-234-9 |
Online ISSN |
2673-5504 |
Received |
17 June 2023 |
Revised |
22 June 2023 |
Accepted |
26 June 2023 |
Issue Date |
17 July 2023 |
DOI |
doi:10.18429/JACoW-SRF2023-MOPMB009 |
Pages |
75-79 |
Copyright |
Published by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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