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https://doi.org/10.18429/JACoW-SRF2023-MOPMB009
Title Plasma Electrolytic Polishing Technology Progress Development for Nb and Cu Substrates Preparation
Authors
  • E. Chyhyrynets, O. Azzolini, R. Caforio, D. Fonnesu, D. Ford, G. Keppel, C. Pira, A. Salmaso, F. Stivanello
    INFN/LNL, Legnaro (PD), Italy
  • G. Marconato
    Università degli Studi di Padova, Padova, Italy
Abstract Superconducting radio frequency (SRF) cavity performance is highly dependent on surface preparation. Conventionally, electropolishing (EP) is used to achieve a clean surface and low roughness for both Nb and Cu substrates, but it requires harsh and corrosive solutions like concentrated acids. Plasma Electrolytic Polishing (PEP) is a promising alternative that uses only diluted salt solutions and has several advantages over EP. PEP can replace intermediate steps like mechanical or chemical polishing, thanks to its superior removal rate of up to 2-8 um/min of Nb and 3-30 um/min of Cu. It achieves Ra roughness of 100 nm for both substrates and has a higher smoothing effect than EP. PEP is also suitable for normal conducting cavities and other accelerator components, including couplers. We demonstrate the effectiveness of PEP on SRF substrates and analyse substrate defect evaluation. We demonstrate the application of PEP onto SRF substrates and analyse the substrate’s defect evaluation. The ongoing work includes Nb bulk and Nb on Cu QPR treatments and RF tests in collaboration with HZB.
Funding Work supported by the INFN CSNV experiment SAMARA. Fundings from the EU’s Horizon 2020 Research and Innovation programme under Grant Agreement N 101004730. PNRR MUR project PE0000023-NQSTI.
Paper download MOPMB009.PDF [0.576 MB / 5 pages]
Poster download MOPMB009_POSTER.PDF [11.877 MB]
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Conference SRF2023
Series International Conference on RF Superconductivity (21st)
Location Grand Rapids, MI, USA
Date 25-30 June 2023
Publisher JACoW Publishing, Geneva, Switzerland
Editorial Board Kenji Saito (FRIB, MSU, East Lansing, MI, USA); Ting Xu (FRIB, MSU, East Lansing, MI, USA); Naruhiko Sakamoto (RIKEN, Wako, Japan); Volker R.W. Schaa (GSI, Darmstadt, Germany); Paul W. Thomas (FRIB, MSU, East Lansing, MI, USA)
Online ISBN 978-3-95450-234-9
Online ISSN 2673-5504
Received 17 June 2023
Revised 22 June 2023
Accepted 26 June 2023
Issue Date 17 July 2023
DOI doi:10.18429/JACoW-SRF2023-MOPMB009
Pages 75-79
Copyright
Creative Commons CC logoPublished by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.