| Title |
Simulations of RF Field-induced Thermal Feedback in Niobium and Nb3Sn Cavities |
| Authors |
- J. Ding, D.L. Hallpresenter
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
- M. Liepe
Cornell University, Ithaca, New York, USA
|
| Abstract |
Thermal feedback is a known limitation for SRF cavities made of low-purity niobium, as the increased losses at higher temperature described by BCS theory create a feedback mechanism that can eventually result in a runaway effect and associated cavity quench. In a similar manner, niobium cavities coated with Nb3Sn may also be subject to increased losses from thermal feedback, as Nb3Sn is possessed of a much lower thermal conductivity than niobium, although this effect will be mitigated by the thin film nature of the coating. In order to better understand the degree to which thermal feedback plays a role in the performance of Nb3Sn cavities, it is necessary to understand how the various components of the problem play a role in the outcome. In this paper, we present the first results from simulations performed at Cornell University that model RF induced thermal feedback in both conventional niobium cavities and niobium cavities coated with a thin film of Nb3Sn. The impacts of layer thickness, niobium substrate thermal conductivity, and trapped flux on the performance of the cavity are discussed.
|
| Paper |
download THPB079.PDF [0.519 MB / 5 pages] |
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| Conference |
SRF2017, Lanzhou, China |
| Series |
International Conference on RF Superconductivity (18th) |
| Proceedings |
Link to full SRF2017 Proccedings |
| Session |
Poster Session |
| Date |
20-Jul-17 14:00–17:00 |
| Main Classification |
Fundamental SRF R&D |
| Sub Classification |
Other than bulk Nb |
| Keywords |
ion, cavity, niobium, simulation, feedback |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Volker RW Schaa (GSI, Darmstadt, Germany); Yuan He (IMP, Lanzhou, China); Lu Li (IMP, Lanzhou, China); Ning Zhao (IHEP, Beijing, China) |
| ISBN |
978-3-95450-191-5 |
| Published |
January 2018 |
| Copyright |
|
