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URLhttps://doi.org/10.18429/JACoW-SAP2025-WEXC6
TitleBeam extraction and dark current study of a C-band RF photo gun
Authors
  • X. Liu, J. Zhu
    China Spallation Neutron Source, Institute of High Energy Physics, Chinese Academy of Sciences
  • S. Jiang, S. Liu, X. Li
    Institute of High Energy Physics, Chinese Academy of Sciences
  • H. Zhang
    Dongguan Neutron Science Center, Institute of High Energy Physics, Chinese Academy of Sciences
AbstractC-band RF photo gun is being developed worldwide for better electron bunch emittance, aiming to be used in advanced light sources such as diffraction-limited storage rings and free electron lasers. Initial beam tests of a 3.6-cell C-band RF photo gun achieved 6.6 MeV beam energy at 137 MV/m cathode gradient were conducted, along with high dark current; Surface checks revealed electron damage on cathodes and disk apertures after these tests. To understand and suppress the dark current, surface cleaning methods and preliminary numerical simulations have also been conducted, and the results are discussed.
Paperdownload: WEXC6.pdf
CiteBibTeX, LaTeX, Text/Word, RIS, EndNote
Conference15th Symposium on Accelerator Physics
Series
LocationUrumqi, China
Date02-05 Sep 2025
PublisherJACoW Publishing, Geneva, Switzerland
Editorial BoardLin Bian - Editor in Chief (IHEP), Zhichu Chen (SARI), Fancong Zeng (IHEP).
Online ISBN978-3-95450-279-0
Online ISSN3043-0208
Received20 October 2025
Revised10 November 2025
Accepted11 November 2025
Issued09 March 2026
DOI10.18429/JACoW-SAP2025-WEXC6
Pages9-11