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URLhttps://doi.org/10.18429/JACoW-SAP2025-FRMC6
TitleReal-time comprehensive electron beam diagnostics through machine learning in ultrafast electron diffraction system
Authors
  • J. Li, C. Tsai, K. Fan
    Huazhong University of Science and Technology
AbstractUltrafast electron diffraction (UED) is a powerful technique for observing atomic-scale structural dynamics in materials. Electron beam parameters—beam size, divergence, energy spread, and bunch length—determine spatio-temporal resolution. Traditional diagnostic methods require complex instrumentation that cannot be integrated into routine workflows, particularly for high-repetition-rate facilities. We present a machine learning approach enabling comprehensive, non-invasive extraction of electron beam parameters directly from diffraction patterns. Deep neural networks trained on physics-based simulations decode signatures that beam parameters imprint on diffraction images. The method exploits distinct physical mechanisms: geometric effects from beam size, angular distortions from divergence, chromatic aberrations from energy spread, and temporal convolution from bunch length. This enables bunch length measurement without dedicated temporal diagnostics—traditionally one of the most challenging parameters to access non-invasively. The trained models can be deployed across UED facilities using standard imaging detectors, democratizing access to advanced diagnostics. This approach eliminates expensive specialized equipment and enables real-time beam monitoring and optimization, enhancing experimental throughput and data quality for ultrafast materials characterization.
Paperdownload: FRMC6.pdf
CiteBibTeX, LaTeX, Text/Word, RIS, EndNote
Conference15th Symposium on Accelerator Physics
Series
LocationUrumqi, China
Date02-05 Sep 2025
PublisherJACoW Publishing, Geneva, Switzerland
Editorial BoardLin Bian - Editor in Chief (IHEP), Zhichu Chen (SARI), Fancong Zeng (IHEP).
Online ISBN978-3-95450-279-0
Online ISSN3043-0208
Received13 September 2025
Revised10 November 2025
Accepted10 November 2025
Issued09 March 2026
DOI10.18429/JACoW-SAP2025-FRMC6
Pages83-86