| Title |
High-Level Physics Application for the Emittance Measurement by Allison Scanner |
| Authors |
- T. Zhang, S.M. Lund, T. Maruta
FRIB, East Lansing, Michigan, USA
- C.Y. Wong
NSCL, East Lansing, Michigan, USA
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| Abstract |
On the ion accelerator, transverse emittance diagnostics usually happens at the low-energy transportation region, one device named "Allison Scanner" is commonly used to achieve this goal. In this contribution, we present the software development for both the high-level GUI application and the online data analysis, to help the users to get the beam transverse emittance information as precise and efficient as possible, meanwhile, the entire workflow including the UI interaction would be smooth and friendly enough. One soft-IOC application has been created for the device simulation and application development. A dedicated 2D image data visualization widget is also introduced for general-purposed PyQt GUI development.
|
| Funding |
Work supported by the U.S. Department of Energy Office of Science under Cooperative Agreement DESC0000661 |
| Paper |
download TUPLS05.PDF [2.270 MB / 4 pages] |
| Export |
download ※ BibTeX
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※ EndNote |
| Conference |
NAPAC2019 |
| Series |
North American Particle Accelerator Conference (4th) |
| Location |
Lansing, MI, USA |
| Date |
01-06 September 2019 |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editorial Board |
Yoshishige Yamazaki (MSU, East-Lansing, MI, USA); Tor Raubenheimer (SLAC, Stanford, CA, USA); Amy McCausey (FRIB, East-Lansing, MI, USA); Volker RW Schaa (GSI, Darmstadt, Germany) |
| Online ISBN |
978-3-95450-223-3 |
| Online ISSN |
2673-7000 |
| Received |
26 August 2019 |
| Accepted |
05 September 2019 |
| Issue Date |
08 October 2019 |
| DOI |
doi:10.18429/JACoW-NAPAC2019-TUPLS05 |
| Pages |
459-462 |
| Copyright |
 Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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