<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Qiang, J.</author>
             <author>Hwang, K.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Modeling of Dark Current Generation and Transport Using the IMPACT-T Code
          </title>
       </titles>
		 <publisher>JACoW</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-180-9</isbn>
		 <electronic-resource-num>10.18429/JACoW-NAPAC2016-WEPOB29</electronic-resource-num>
		 <language>English</language>
		 <pages>964-966</pages>
       <pages>WEPOB29</pages>
       <keywords>
          <keyword>ion</keyword>
          <keyword>electron</keyword>
          <keyword>cavity</keyword>
          <keyword>cathode</keyword>
          <keyword>space-charge</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2017</year>
          <pub-dates>
             <date>2017-01</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>http://dx.doi.org/10.18429/JACoW-NAPAC2016-WEPOB29</url>
              <url>https://jacow.org/napac2016/papers/wepob29.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          Dark current from unwanted electrons in photoinjector can present significant danger to the accelerator operation by causing damage to photocathode and power deposition onto conducting wall. In this paper, we present numerical models of dark current generation from the field emission and from the electron impact ionization of the residual gas that were recently developed in the IMPACT-T code. We also report on the application of above numerical model to an LCLS-II like photoinjector.
       </abstract>
    </record>
  </records>
</xml>
