<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Edelen, J.P.</author>
             <author>Harris, J.R.</author>
             <author>Lewellen, J.W.</author>
             <author>Sun, Y.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Analytical Modeling of Electron Back-Bombardment Induced Current Increase in Un-Gated Thermionic Cathode Rf Guns
          </title>
       </titles>
		 <publisher>JACoW</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-180-9</isbn>
		 <electronic-resource-num>10.18429/JACoW-NAPAC2016-WEPOB25</electronic-resource-num>
		 <language>English</language>
		 <pages>953-955</pages>
       <pages>WEPOB25</pages>
       <keywords>
          <keyword>ion</keyword>
          <keyword>gun</keyword>
          <keyword>cathode</keyword>
          <keyword>electron</keyword>
          <keyword>simulation</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2017</year>
          <pub-dates>
             <date>2017-01</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>http://dx.doi.org/10.18429/JACoW-NAPAC2016-WEPOB25</url>
              <url>https://jacow.org/napac2016/papers/wepob25.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          In this paper we derive analytical expressions for the output current of an un-gated thermionic cathode RF gun in the presence of back-bombardment heating. We provide a brief overview of back-bombardment theory and discuss comparisons between the analytical back-bombardment predictions and simulation models. We then derive an expression for the output current as a function of the RF repetition rate and discuss relationships between back-bombardment, field-enhancement, and output current. We discuss in detail the relevant approximations and then provide predictions about how the output current should vary as a function of repetition rate for some given system configurations.
       </abstract>
    </record>
  </records>
</xml>
