<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Borland, M.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Simulation of Swap-Out Reliability for the Advance Photon Source Upgrade
          </title>
       </titles>
		 <publisher>JACoW</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-180-9</isbn>
		 <electronic-resource-num>10.18429/JACoW-NAPAC2016-WEPOB02</electronic-resource-num>
		 <language>English</language>
		 <pages>881-883</pages>
       <pages>WEPOB02</pages>
       <keywords>
          <keyword>ion</keyword>
          <keyword>operation</keyword>
          <keyword>injection</keyword>
          <keyword>simulation</keyword>
          <keyword>lattice</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2017</year>
          <pub-dates>
             <date>2017-01</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>http://dx.doi.org/10.18429/JACoW-NAPAC2016-WEPOB02</url>
              <url>https://jacow.org/napac2016/papers/wepob02.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          The proposed upgrade of the Advanced Photon Source (APS) to a multibend achromat lattice relies on the use of swap-out injection to accommodate the small dynamic acceptance, allow use of unusual insertion devices, and minimize collective effects at high single-bunch charge. This, combined with the short beam lifetime, will make injector reliability even more important than it is for top-up operation. We used historical data for the APS injector complex to obtain probability distributions for injector up-time and down-time durations. Using these distributions, we simulated several years of swap-out operation for the upgraded lattice for several operating modes. The results indicate that obtaining very high availability of beam in the storage ring will require improvements to injector reliability.
       </abstract>
    </record>
  </records>
</xml>
