Duan, Q.H. Han, Q. Li, Z. Liu, S. Yue, Z.Y. Zhang, Q. JACoW Publishing Geneva, Switzerland The development of x-ray white beam profile monitor is to realize the visual detection of beam contour and position under the condition of high energy and high heat load of HEPS fourth-generation light source. The device includes a electric drive system, an imaging system, and a copper-cooled CVD diamond monitor. SPECTRA and ANSYS were used to verify the mechanism temperature reliability when monitor being used in different HEPS beamlines at current of 200 mA. At the same time, the functional verification of the experimental prototype was carried out on the 3W1 high energy test beamline of BSRF, white beam fluorescence images were successfully obtained. During the test of Multilayer Monochromator for Structural Dvnamics Beamline(HEPS), the change images of white and monochromatic beam profiles and curve of intensity distribution during crystal adjustment are successfully obtained, which verificates the processing function of the monitor for beam profile and intensity distribution.