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  <records>
    <record>
       <contributors>
          <authors>
             <author>Liu, Z.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Temperature-Dependent Elastic Constants and Young’s Modulus of Silicon Single Crystal
          </title>
       </titles>
       <publisher>JACoW Publishing</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>2673-5520</isbn>
		 <isbn>978-3-95450-229-5</isbn>
		 <electronic-resource-num>10.18429/JACoW-MEDSI2020-WEPC09</electronic-resource-num>
		 <language>English</language>
		 <pages>324-326</pages>
       <keywords>
          <keyword>cryogenics</keyword>
          <keyword>lattice</keyword>
          <keyword>synchrotron</keyword>
          <keyword>photon</keyword>
          <keyword>synchrotron-radiation</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2021</year>
          <pub-dates>
             <date>2021-10</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>https://doi.org/10.18429/JACoW-MEDSI2020-WEPC09</url>
              <url>https://jacow.org/medsi2020/papers/wepc09.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          Silicon crystals have been widely applied for x-ray monochromators. It is an anisotropic material with temperature dependent properties. Values of its thermal properties from cryogenic to high temperature are available in literature for expansion, conductivity, diffusivity, heat capacity, but neither elastic constants nor Young’s modulus. X-ray monochromators may be liquid-nitrogen cooled or water cooled. Finite Element Analysis (FEA) is commonly used to predict thermal performance of monochromators. The elastic constants and Young’s modulus over cryogenic and high temperature are now collected and derived from literature, with the purpose of assisting in providing accurate FEA predictions.
       </abstract>
    </record>
  </records>
</xml>
