Gießel, T. Fuchs, F. Langer, B. Rühl, E. Schäfers, F. JACoW Publishing Geneva, Switzerland Samples illuminated by pulsed soft X-rays with a large number of photons per pulse (XFEL, Laser-plasma sources) often restrict analytical methods to photon-in-photon-out techniques, since photon-in-electron-out techniques can suffer severely from space charge. We introduce a compact and large angle acceptance soft X-ray spectrometer for an energy range of 1-3 keV suitable for experiments under the above conditions. The spectrometer uses a von Hamos optical design covering a simultaneous energy window of >300 eV at a resolving power of 1200-2800 and a total length of the spectrometer of <600 mm. We will present design details and first performance test results.