Oprondek, S.M. Downey, J.S. Jaski, Y. Lee, S.H. Mulvey, J. Ramanathan, M. Westferro, F. Yang, B.X. JACoW Publishing Geneva, Switzerland 978-3-95450-207-3 10.18429/JACoW-MEDSI2018-TUPH29 English 99-101 TUPH29 detector photon undulator scattering monitoring Contribution to a conference proceedings 2018 2018-12 https://doi.org/10.18429/JACoW-MEDSI2018-TUPH29 http://jacow.org/medsi2018/papers/tuph29.pdf The Advanced Photon Source (APS) upgrade from double-bend achromats (DBA) to multi-bend achromats (MBA) lattice has increased the need for reliable diagnos-tic systems. This upgrade will decrease the size of the photon beam drastically and beam current will be in-creased from 100 mA to 200 mA. The small beam and intense heat loads provided by the upgraded APS requires unique and innovative approaches to beam position monitoring. To meet the need for a reliable diagnostic system for the APS upgrade, the next generation X-ray Beam Position Monitoring System (XBPM) is required which includes the first XBPM (XBPM1), the Intensity Monitor (IM1) and the second XBPM (XBPM2). This paper presents progress and status of the current configu-ration of the XBPM system especially the development work involving the IM1 and XBPM2. The R&D work to develop an alternative XBPM1 using the Compton scattering principle is also presented.