Eggenstein, F. Bischoff, P. Erko, A. Schäfers, F. Senf, F. Sokolov, A. Zeschke, T. JACoW Publishing Geneva, Switzerland At BESSY-II we have recently set up a new UV- and XUV optics beamline *,** with an in-house developed versatile reflectometer *** for at-wavelength metrology on reflective and diffractive live sized optical elements up to 4 kg load. High precision measurements of the reflection and polarization properties are feasible by a 360° azimuthal rotation of the sample around the beam of light, where samples can be adjusted reproducibly with a novel UHV-Tripod within arcsec and µm precision. By the tripod the sample is adjustable in 6 degree of freedom: Translations Tx,Ty an Tz and rotations Rx,Ry and Rz while the goniometers rotate the tripod. The two years of operation of the tripod system helped to develop a new tripod geometry for better performance. A new tripod design is presented and compared to the existing system.