<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Hüning, M.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Bunch Length Measurements using Transverse Deflecting Systems
          </title>
       </titles>
		 <publisher>JACoW Publishing</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>2226-0366</isbn>
		 <isbn>978-3-95450-194-6</isbn>
		 <electronic-resource-num>10.18429/JACoW-LINAC2018-FR1A02</electronic-resource-num>
		 <language>English</language>
		 <pages>972-976</pages>
       <pages>FR1A02</pages>
       <keywords>
          <keyword>FEL</keyword>
          <keyword>diagnostics</keyword>
          <keyword>electron</keyword>
          <keyword>emittance</keyword>
          <keyword>beam-diagnostic</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2019</year>
          <pub-dates>
             <date>2019-01</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>https://doi.org/10.18429/JACoW-LINAC2018-FR1A02</url>
              <url>http://jacow.org/linac2018/papers/fr1a02.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          Shorter and shorter bunch lengths (some 10 fs) require sophisticated bunch length measurent devices. Free electron lasers - but not only - use transverse deflecting systems. Employing suitable diagnostic tools measurements are not limited to bunch lengths but can be extended to longitudinal profiles and phase-space distributions, and slice emittances. Not only do successfully operated systems aid the commissioning and operation of FELs but they allow control over more sophisticated phase-space manipulations. The design and construction of such systems, actually operated at different RF frequencies, includes cavity design and fabrication, powerful RF systems, low level RF control, beam lines, diagnostics, and data analysis.
       </abstract>
    </record>
  </records>
</xml>
