| Title |
An Analysis of Fast Sputtering Studies for Ion Confinement Time |
| Authors |
- D.E. Neben, G. Machicoane, A.N. Pham, J.W. Stetson
NSCL, East Lansing, Michigan, USA
- G. Machicoane
FRIB, East Lansing, USA
- G. Parsey
MSU, East Lansing, Michigan, USA
- J.P. Verboncoeur
Michigan State University, East Lansing, Michigan, USA
|
| Abstract |
Existing heavy ion facilities such as the National Superconducting Cyclotron Laboratory at Michigan State University rely on Electron Cyclotron Resonance (ECR) ion sources as injectors of highly charged ion beams. Long ion confinement times are necessary to produce dense populations of highly charged ions because of steadily decreasing ionization cross sections with increasing charge state. To further understand ion extraction and confinement we are using a fast sputtering technique first developed at Argonne National Laboratory (ANL) [1] to introduce a small amount of uranium metal into the plasma at a well-defined time. We present an analytical solution to the coupled ion density rate equations for using a piecewise constant neutral density to interpret the fast sputtering method.
|
| Footnotes & References |
*R. Vondrasek et al., Rev. Sci. Instrum. 73, 548-551 (2002). |
| Funding |
This work was supported by Michigan State University and the National Science Foundation: NSF Award Number PHY-1415462 |
| Paper |
download TUPRC032.PDF [0.195 MB / 3 pages] |
| Poster |
download TUPRC032_POSTER.PDF [0.699 MB] |
| Export |
download ※ BibTeX
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※ EndNote |
| Conference |
LINAC2016, East Lansing, MI, USA |
| Series |
Linear Accelerator Conference (28th) |
| Proceedings |
Link to full LINAC2016 Proccedings |
| Session |
Poster Session |
| Date |
27-Sep-16 16:00–17:00 |
| Main Classification |
4 Beam Dynamics, Extreme Beams, Sources and Beam Related Technology |
| Sub Classification |
4B Electron and Ion Sources, Guns, Photo Injectors, Charge Breeders |
| Keywords |
ion, plasma, electron, ECRIS, ion-source |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Yoshishige Yamazaki (FRIB/MSU, East Lansing, MI, USA); Alberto Facco (FRIB/MSU, East Lansing, MI, USA); Amy McCausey (FRIB/MSU, East Lansing, MI, USA); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-169-4 |
| Published |
May 2017 |
| Copyright |
|
