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https://doi.org/10.18429/JACoW-LINAC2016-MOPRC027
Title Surface Roughness Effect on the Performance of Nb3Sn Cavities
Authors
  • R.D. Porter, D.L. Hall, M. Liepe, J.T. Maniscalco
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
Abstract Surface roughness of current Niobium-3 Tin (Nb3Sn) superconducting radio-frequency (SRF) accelerator cavities can cause enhancement of the surface magnetic field. This enhancement can push the surface magnetic field beyond the critical field, which, if it occurs over a large enough area, can cause the cavity to quench. This paper presents simulations of the surface magnetic field enhancements in SRF cavities caused by the surface roughness of current Cornell Nb3Sn cavities, which have achieved record efficiency. Simple, smooth cavity geometry is defined and surface magnetic fields calculated using SLANS2. The cavity geometry is modified with a small rough region for which the geometry is determined from AFM scans of a Nb3Sn coated sample and the surface fields are calculated again. The calculated surface fields of the smooth and rough cavities are compared to determine the extent of the field enhancement, the area over which the enhancement is significant, and which surface features cause large field enhancement. We find that 1% of the surface analyzed has fields enhance by more than 45%. On average the Q-factor is increased by (3.8 ± 1.0) \%.
Funding DOE award DE-SC0008431
Paper download MOPRC027.PDF [6.712 MB / 4 pages]
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Conference LINAC2016, East Lansing, MI, USA
Series Linear Accelerator Conference (28th)
Proceedings Link to full LINAC2016 Proccedings
Session Poster Session
Date 26-Sep-16   16:00–17:00
Main Classification 3 Technology
Sub Classification 3A Superconducting RF
Keywords cavity, SRF, pulsed-power, niobium, klystron
Publisher JACoW, Geneva, Switzerland
Editors Yoshishige Yamazaki (FRIB/MSU, East Lansing, MI, USA); Alberto Facco (FRIB/MSU, East Lansing, MI, USA); Amy McCausey (FRIB/MSU, East Lansing, MI, USA); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-169-4
Published May 2017
Copyright
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