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| URL | https://doi.org/10.18429/JACoW-IPAC2025-WEPB028 |
|---|---|
| Title | Kicker magnets for fast-switching elliptical polarized undulators beamline of the TPS |
| Authors |
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| Abstract | The variation of polarized light is a critical characteristic of synchrotron radiation sources. To accommodate diverse user needs and enable helicity switching, a soft X-ray beamline has been designed to alternate the helicity of polarized undulator radiation. This is achieved by switching between two undulators, configured to provide right and left circularly polarized radiation, respectively. To separate and select these two circularly polarized photon beams, six kicker magnets are installed in the straight section. This paper details the design considerations, fabrication processes, and field measurement results of these kicker magnets, emphasizing their role in achieving seamless helicity switching and supporting the beamline’s functionality for cohabitation of multiple users. |
| Paper | download: WEPB028.pdf |
| Cite | BibTeX, LaTeX, Text/Word, RIS, EndNote |
| Conference | 16th International Particle Accelerator Conference |
| Series | |
| Location | Taipei, Taiwan |
| Date | 01-06 Jun 2025 |
| Publisher | JACoW Publishing, Geneva, Switzerland |
| Editorial Board | * Ming-Chyuan Lin - National Synchrotron Radiation Research Center * Yoichi Sato - KEK * Jui-Che Huang - National Synchrotron Radiation Research Center * David Button - Australian Nuclear Science and Technology Organisation * Ping-Shun Chuang - National Synchrotron Radiation Research Center |
| Online ISBN | 978-3-95450-248-6 |
| Online ISSN | 2673-5490 |
| Received | 28 May 2025 |
| Revised | 04 June 2025 |
| Accepted | 04 June 2025 |
| Issued | 05 November 2025 |
| DOI | 10.18429/JACoW-IPAC2025-WEPB028 |
| Pages | 1796-1798 |
| Copyright | Published by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |