THPM064

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URL	https://doi.org/10.18429/JACoW-IPAC2025-THPM064
Title	Terahertz streaking detection for longitudinal bunch diagnostics at FLUTE
Authors	M. Nabinger, A. Mueller, A. Malygin, E. Bründermann, J. Schaefer, J. Steinmann, M. Schuh, M. Noll, M. Fuchs, M. Nasse, N. Smale, R. Ruprecht, T. Schmelzer Karlsruhe Institute of Technology M. Moser, M. Dehler, R. Ischebeck, V. Schlott Paul Scherrer Institute M. Hayati, T. Feurer, Z. Ollmann University of Bern O. Boine-Frankenheim, S. Glukhov Technical University of Darmstadt
Abstract	The Karlsruhe Institute of Technology is currently exploring a compact method of longitudinal electron bunch diagnostics with femtosecond resolution that has recently been demonstrated for other parameter ranges. The experimental setup utilizes a THz-based streaking approach with resonator structures, achieving both high compactness and efficiency. In this paper, we report on the experimental observation of streaking signals with our Compact Transverse Deflecting System, which has been successfully tested using two different resonators, an Inverse Split-Ring Resonator and a Tilted-Slit-Resonator.
Paper	download: THPM064.pdf
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Conference	16th International Particle Accelerator Conference
Series
Location	Taipei, Taiwan
Date	01-06 Jun 2025
Publisher	JACoW Publishing, Geneva, Switzerland
Editorial Board	* Ming-Chyuan Lin - National Synchrotron Radiation Research Center * Yoichi Sato - KEK * Jui-Che Huang - National Synchrotron Radiation Research Center * David Button - Australian Nuclear Science and Technology Organisation * Ping-Shun Chuang - National Synchrotron Radiation Research Center
Online ISBN	978-3-95450-248-6
Online ISSN	2673-5490
Received	28 May 2025
Revised	01 June 2025
Accepted	05 June 2025
Issued	05 November 2025
DOI	10.18429/JACoW-IPAC2025-THPM064
Pages	2822-2825
Copyright	Published by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.