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URLhttps://doi.org/10.18429/JACoW-IPAC2025-THPB005
TitleSurface characterization of vacuum chambers with synchrotron radiation exposure at a beamline
Authors
  • G. Hsiung, C. Chan, C. Cheng, C. Shueh
    National Synchrotron Radiation Research Center
  • R. Valizadeh
    Science and Technology Facilities Council
AbstractExposure of synchrotron radiation on the vacuum chambers induces high yield of photoelectrons and the consequent increase of pressure from stimulated gas desorption. Characterization of the surface quality of vacuum chambers, either after chemical cleaning or with thin film coating, by synchrotron radiation exposure at a beamline is powerful and sensitive. In this study, analysis of photo-desorption and photoelectron yield for various vacuum chambers, metallic tubes with or without NEG-coatings, at the BL19B-beamline of Taiwan Light Source (TLS) with critical photon energy of 2.14 keV will be described and compared.
Paperdownload: THPB005.pdf
CiteBibTeX, LaTeX, Text/Word, RIS, EndNote
Conference16th International Particle Accelerator Conference
Series
LocationTaipei, Taiwan
Date01-06 Jun 2025
PublisherJACoW Publishing, Geneva, Switzerland
Editorial Board* Ming-Chyuan Lin - National Synchrotron Radiation Research Center * Yoichi Sato - KEK * Jui-Che Huang - National Synchrotron Radiation Research Center * David Button - Australian Nuclear Science and Technology Organisation * Ping-Shun Chuang - National Synchrotron Radiation Research Center
Online ISBN978-3-95450-248-6
Online ISSN2673-5490
Received28 May 2025
Revised31 May 2025
Accepted31 May 2025
Issued05 November 2025
DOI10.18429/JACoW-IPAC2025-THPB005
Pages2510-2512