| Title |
Beam Profile Monitor for Slow Extracted Beam Using Multi-Layered Graphene at J-PARC |
| Authors |
- Y. Hashimoto, Y. Hori, R. Muto, M. Tomizawa, T. Toyama, M. Uota
KEK, Tokai, Ibaraki, Japan
- M. Endo, H. Sakai
Mitsubishi Electric System & Service Co., Ltd, Tsukuba, Japan
- M. Murakami, K. Murashima, M. Tachibana, A. Tatami
KANEKA, Osaka, Japan
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| Abstract |
Extracted-beam profiles in slow extraction at J-PARC has been measured by using secondary electrons emitted from a target array made by multi-layered graphen, in real time during spill time of around 2 seconds. The target array consists of 20 ribbons with width of 1 mm, pitch of 2 mm, and thickness of 1.1 micron. Secondary-electron current at each channel is measured by a current amplifier having sensitivity more than 1 pA. These configuration produces useful information for beam dynamics in slow extraction. We have set this monitor at the entrance of a septum magnet, then we can also measure the last few-turns beam with the extracted beam simultaneously. We will discuss about features of this instrument and recent beam study with 51 kW extracted-beams.
|
| Paper |
download WEPGW030.PDF [1.327 MB / 4 pages] |
| Export |
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| Conference |
IPAC2019 |
| Series |
International Particle Accelerator Conference (10th) |
| Location |
Melbourne, Australia |
| Date |
19-24 May 2019 |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editorial Board |
Mark Boland (UoM, Saskatoon, SK, Canada); Hitoshi Tanaka (KEK, Tsukuba, Japan); David Button (ANSTO, Kirrawee, NSW, Australia); Rohan Dowd (ANSTO, Kirrawee, NSW, Australia); Volker RW Schaa (GSI, Darmstadt, Germany); Eugene Tan (ANSTO, Kirrawee, NSW, Australia) |
| Online ISBN |
978-3-95450-208-0 |
| Received |
15 May 2019 |
| Accepted |
21 May 2019 |
| Issue Date |
21 June 2019 |
| DOI |
doi:10.18429/JACoW-IPAC2019-WEPGW030 |
| Pages |
2532-2535 |
| Copyright |
 Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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