| Title |
The Potential of Heavy Ion Beams to Provide Secondary Muon/Neutrino Beam |
| Authors |
- H.-J. Cai, L.W. Chen, L. Yang, S. Zhang
IMP/CAS, Lanzhou, People’s Republic of China
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| Abstract |
This paper focuses on the exploration into the potential of heavy ion beams for the production of the charged pions/muons within different energy ranges which is widely needed for fundamental and applied research. The investigation is performed for the different kinds of beams involving 1H , 4He, 12C, 16O, 40Ar and 136Xe with medium energy within the range of 0.5~2.5 AGeV and high energy of 10 AGeV. Three kinds of typical target configurations, thin graphite plate, long tungsten rod and medium thickness nickel block are adopted. For comparison, graphite and nickel are also used for the long rod geometry. Basically, most of the conventional charged pion/muon beams production cases including surface muon, low energy decay muon, medium energy pion/muon for neutrino beam and highly forward energetic muon are involved and the feasibility of heavy ion beam for these cases is analyzed.
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| Paper |
download THPGW041.PDF [1.066 MB / 3 pages] |
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| Conference |
IPAC2019 |
| Series |
International Particle Accelerator Conference (10th) |
| Location |
Melbourne, Australia |
| Date |
19-24 May 2019 |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editorial Board |
Mark Boland (UoM, Saskatoon, SK, Canada); Hitoshi Tanaka (KEK, Tsukuba, Japan); David Button (ANSTO, Kirrawee, NSW, Australia); Rohan Dowd (ANSTO, Kirrawee, NSW, Australia); Volker RW Schaa (GSI, Darmstadt, Germany); Eugene Tan (ANSTO, Kirrawee, NSW, Australia) |
| Online ISBN |
978-3-95450-208-0 |
| Received |
15 May 2019 |
| Accepted |
20 May 2019 |
| Issue Date |
21 June 2019 |
| DOI |
doi:10.18429/JACoW-IPAC2019-THPGW041 |
| Pages |
3673-3675 |
| Copyright |
 Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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