| Title |
Beam-based Measurement of Broadband Longitudinal Impedance at NSLS-II |
| Authors |
- V.V. Smaluk, B. Bacha, G. Bassi, A. Blednykh
BNL, Upton, Long Island, New York, USA
|
| Abstract |
Interaction of a particle beam with the vacuum chamber impedance is one of the main effects limiting the beam intensity in accelerators. Minimization of the impedance is an essential part of the vacuum chamber design for any new accelerator project. The impedance can be estimated experimentally by measuring beam dynamics effects caused by the beam-impedance interaction. Experience obtained at many accelerator facilities shows the beam-based measurements are often different from the pre-computed impedance budgets, the discrepancy of a factor of two or even more is not unusual. The measurements of broadband longitudinal impedance carried out at NSLS-II are discussed in comparison with the numerically simulated impedance budget.
|
| Funding |
Department of Energy Contract No. DE-SC0012704 |
| Paper |
download MOPGW122.PDF [0.206 MB / 3 pages] |
| Export |
download ※ BibTeX
※ LaTeX
※ Text/Word
※ RIS
※ EndNote |
| Conference |
IPAC2019 |
| Series |
International Particle Accelerator Conference (10th) |
| Location |
Melbourne, Australia |
| Date |
19-24 May 2019 |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editorial Board |
Mark Boland (UoM, Saskatoon, SK, Canada); Hitoshi Tanaka (KEK, Tsukuba, Japan); David Button (ANSTO, Kirrawee, NSW, Australia); Rohan Dowd (ANSTO, Kirrawee, NSW, Australia); Volker RW Schaa (GSI, Darmstadt, Germany); Eugene Tan (ANSTO, Kirrawee, NSW, Australia) |
| Online ISBN |
978-3-95450-208-0 |
| Received |
15 May 2019 |
| Accepted |
23 May 2019 |
| Issue Date |
21 June 2019 |
| DOI |
doi:10.18429/JACoW-IPAC2019-MOPGW122 |
| Pages |
400-402 |
| Copyright |
 Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
|
