Cao, S.S. Leng, Y.B. Yuan, R.X. JACoW Publishing Geneva, Switzerland 978-3-95450-184-7 10.18429/JACoW-IPAC2018-THPML061 English 4777-4779 THPML061 Contribution to a conference proceedings 2018 2018-06 https://doi.org/10.18429/JACoW-IPAC2018-THPML061 http://jacow.org/ipac2018/papers/thpml061.pdf The high repetition-rate and high peak brilliance of X-ray free-electron laser (XFEL) allow studying many scientific experiments that have not been feasible. To realize such high performance, a sub-micron beam transverse position measurement is required. The cavity-type beam position monitor (CBPM), as a non-destructive diagnostics tool with high potential in resolution performance, has been applied in different free electron laser facilities (FELs). In this research, an X-band high bandwidth CBPM has been studied and used for pre-research on bunch-by-bunch diagnostic for the pulsed FEL with high repetition-rate. Its bandwidth reaches 300 MHz. Design considerations and simulation results of the CBPM have been discussed and presented in this paper.