<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Chen, G.</author>
             <author>Adhikari, G.</author>
             <author>Antipov, S.P.</author>
             <author>Baryshev, S.V.</author>
             <author>Jing, C.-J.</author>
             <author>Kovi, K.</author>
             <author>Schroeder, W.A.</author>
             <author>Spentzouris, L.K.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Study of Mean Transverse Energy of (N)UNCD with Tunable Laser Source
          </title>
       </titles>
		 <publisher>JACoW Publishing</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-184-7</isbn>
		 <electronic-resource-num>10.18429/JACoW-IPAC2018-TUPML061</electronic-resource-num>
		 <language>English</language>
		 <pages>1677-1679</pages>
       <pages>TUPML061</pages>
       <keywords>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2018</year>
          <pub-dates>
             <date>2018-06</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>https://doi.org/10.18429/JACoW-IPAC2018-TUPML061</url>
              <url>http://jacow.org/ipac2018/papers/tupml061.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          There is a strong motivation to develop and understand novel materials with the potential to be utilized as photocathodes, as these could have desirable photoemission properties for research and industrial applications. Nitrogen-incorporated ultrananocrystalline diamond ((N)UNCD) photocathodes have potential to become a material of choice for photocathode applications*. (N)UNCD has high quantum efficiency when processed in hydrogen plasma*, low surface roughness, and high electron conductivity through the bulk**. The mean transverse energy (MTE) was calculated for (N)UNCD thin films using the double-solenoid scan method. (N)UNCD thin film with thickness of 160nm was deposited on highly-doped silicon substrate. Studies of the MTE of a (N)UNCD sample were done using a tunable laser source with photon energies of 3.56 eV to 5.26 eV. These results are presented.
       </abstract>
    </record>
  </records>
</xml>
