| Title |
Mirascope Residual-Gas Luminescent Beam Profile Monitors |
| Authors |
- V.G. Dudnikov, R.J. Abramspresenter, M.A. Cummings
Muons, Inc, Illinois, USA
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| Abstract |
Muons, Inc. proposes to develop a Residual-Gas Beam Profile Monitor for Transfer Lines with pulse-to-pulse precision of better than 0.1 mm in position and size that will operate over a wide range of proton beam intensities including those needed for multi-MW beams of future facilities. Traditional solid-based beam intercepting instrumentation produces unallowable levels of radiation at high powers. Our alternative approach is to use a low mass residual-gas profile monitor, where ionization electrons are collected along extended magnetic field lines and the gas composi-tion and pressure in the beam pipe are locally controlled to minimize unwanted radiation and to improve resolu-tion. Beam Induced Fluorescence profile monitor with micrascope light collection is proposed.
|
| Paper |
download WEPAL051.PDF [0.746 MB / 4 pages] |
| Export |
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| Conference |
IPAC2018, Vancouver, BC, Canada |
| Series |
International Particle Accelerator Conference (9th) |
| Proceedings |
Link to full IPAC2018 Proccedings |
| Session |
MC6 Poster Session |
| Date |
02-May-18 09:00–12:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback, and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
electron, controls, diagnostics, proton, operation |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editors |
Shane Koscielniak (TRIUMF, Vancouver, BC, Canada); Todd Satogata (JLab, Newport News, VA, USA); Volker RW Schaa (GSI, Darmstadt, Germany); Jana Thomson (TRIUMF, Vancouver, BC, Canada) |
| ISBN |
978-3-95450-184-7 |
| Published |
June 2018 |
| Copyright |
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