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https://doi.org/10.18429/JACoW-IPAC2018-THPML128
Title Production and Secondary Electron Yield Test of Amorphous Carbon Thin Film
Authors
  • Y.X. Zhang, X.Q. Ge, S.W. Wangpresenter, Y. Wang, W. Wei, B. Zhang
    USTC/NSRL, Hefei, Anhui, People's Republic of China
Abstract Amorphous carbon (a-C) thin film applied to vacuum chambers of high-energy particle accelerators can decrease secondary electron yield(SEY)and suppress electron-cloud effectively. A dc magnetron sputtering apparatus to obtain a-C film has been designed. With the equipment, a-C thin film can be deposited on the inner face of stainless steel pipes ultimately which is uniform and high-quality. Meanwhile, it is found that a-C has a low SEY<1.2 measured by the secondary electron emission measurement set-up in the National Synchrotron Radiation Laboratory. The result indicates that a-C is an ideal material for modern accelerators.
Paper download THPML128.PDF [1.191 MB / 3 pages]
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Conference IPAC2018, Vancouver, BC, Canada
Series International Particle Accelerator Conference (9th)
Proceedings Link to full IPAC2018 Proccedings
Session MC3/6/7 Poster Session
Date 03-May-18   16:00–17:30
Main Classification 07 Accelerator Technology
Sub Classification T14 Vacuum Technology
Keywords electron, vacuum, synchrotron, synchrotron-radiation, site
Publisher JACoW Publishing, Geneva, Switzerland
Editors Shane Koscielniak (TRIUMF, Vancouver, BC, Canada); Todd Satogata (JLab, Newport News, VA, USA); Volker RW Schaa (GSI, Darmstadt, Germany); Jana Thomson (TRIUMF, Vancouver, BC, Canada)
ISBN 978-3-95450-184-7
Published June 2018
Copyright
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cc Creative Commons Attribution 3.0