| Title |
Filling Pattern Measurement System Upgrade in SSRF* |
| Authors |
- N. Zhang, F.Z. Chenpresenter, Y.M. Zhou
SSRF, Shanghai, People's Republic of China
|
| Abstract |
Filling pattern affects various operation performance of a synchrotron light source. A new diagnostic beam charge monitor (BCM) with high bandwidth multi-channels digitizer was developed to perform bunch-by-bunch charge measurement and record filling pattern for SSRF storage ring. Signals picked up from button elec-trodes were sampled synchronously with RF frequency, and IQ (In-phase and Quadrature phase) sampling meth-od was employed for noise-filtering and phase independ-ence calibration. Layout and evaluation experiment of the system are presented in this paper.
|
| Funding |
Work supported by National Natural Science Foundation of China (No.11575282 No.11375255 No.11305253) |
| Paper |
download THPML066.PDF [0.592 MB / 3 pages] |
| Export |
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| Conference |
IPAC2018, Vancouver, BC, Canada |
| Series |
International Particle Accelerator Conference (9th) |
| Proceedings |
Link to full IPAC2018 Proccedings |
| Session |
MC3/6/7 Poster Session |
| Date |
03-May-18 16:00–17:30 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback, and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
operation, storage-ring, SRF, synchrotron, injection |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editors |
Shane Koscielniak (TRIUMF, Vancouver, BC, Canada); Todd Satogata (JLab, Newport News, VA, USA); Volker RW Schaa (GSI, Darmstadt, Germany); Jana Thomson (TRIUMF, Vancouver, BC, Canada) |
| ISBN |
978-3-95450-184-7 |
| Published |
June 2018 |
| Copyright |
|
