<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Li, Y.</author>
             <author>Fang, W.</author>
             <author>Gong, J.Z.</author>
             <author>Gu, Q.</author>
             <author>Guo, J.J.</author>
             <author>Li, L.</author>
             <author>Li, Z.B.</author>
             <author>Tan, J.H.</author>
             <author>Xiao, C.C.</author>
             <author>Zhang, J.Q.</author>
             <author>Zhang, M.</author>
             <author>Zhao, Z.T.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             PXIe Embedded Control Station Based the Electric Breakdown Data Acquisition and RF Conditioning System for C-Band Accelerating Structures Using for Shanghai Soft X-Ray Free Electron Laser (SXFEL)
          </title>
       </titles>
		 <publisher>JACoW</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-182-3</isbn>
		 <electronic-resource-num>10.18429/JACoW-IPAC2017-TUPIK069</electronic-resource-num>
		 <language>English</language>
		 <pages>1855-1857</pages>
       <pages>TUPIK069</pages>
       <keywords>
          <keyword>controls</keyword>
          <keyword>hardware</keyword>
          <keyword>FPGA</keyword>
          <keyword>vacuum</keyword>
          <keyword>laser</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2017</year>
          <pub-dates>
             <date>2017-05</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>http://dx.doi.org/10.18429/JACoW-IPAC2017-TUPIK069</url>
              <url>http://jacow.org/ipac2017/papers/tupik069.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          Shanghai Soft X-Ray Free Electron Laser (SXFEL) adopts C-band structure to accelerate the electron to 1.5-GeV. Due to high gradient operation, the electric breakdown and structure conditioning problems need to be perfectly resolved. For this purpose, we develop an automatic conditioning control and electric breakdown data acquisition system. The control based on a PXI Express (PXIe) embedded frame and the LabView-FPGA technique. The prototype system design, the software programming and hardware test will be introduced. The experiment setup and test results for a low-level signal will be shown.
       </abstract>
    </record>
  </records>
</xml>
