| Title |
PXIe Embedded Control Station Based the Electric Breakdown Data Acquisition and RF Conditioning System for C-Band Accelerating Structures Using for Shanghai Soft X-Ray Free Electron Laser (SXFEL) |
| Authors |
- Y. Li, W. Fang, J.Z. Gong, Q. Gu, J.J. Guo, L. Li, Z.B. Lipresenter, J.H. Tan, C.C. Xiao, J.Q. Zhang, M. Zhang, Z.T. Zhao
SINAP, Shanghai, People's Republic of China
|
| Abstract |
Shanghai Soft X-Ray Free Electron Laser (SXFEL) adopts C-band structure to accelerate the electron to 1.5-GeV. Due to high gradient operation, the electric breakdown and structure conditioning problems need to be perfectly resolved. For this purpose, we develop an automatic conditioning control and electric breakdown data acquisition system. The control based on a PXI Express (PXIe) embedded frame and the LabView-FPGA technique. The prototype system design, the software programming and hardware test will be introduced. The experiment setup and test results for a low-level signal will be shown.
|
| Footnotes & References |
' Corresponding author: liyingmin@sinap.ac.cn |
| Funding |
Shanghai Institute of Applied Physics, The Chinese Academy of Science., National Development and Reform Commission, the People's Republic of China., National Natural Science Foundation of China. |
| Paper |
download TUPIK069.PDF [1.014 MB / 3 pages] |
| Export |
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| Conference |
IPAC2017, Copenhagen, Denmark |
| Series |
International Particle Accelerator Conference (8th) |
| Proceedings |
Link to full IPAC2017 Proccedings |
| Session |
Posters Tuesday 2 |
| Date |
16-May-17 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T23 Machine Protection |
| Keywords |
controls, hardware, FPGA, vacuum, laser |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Volker RW Schaa (GSI, Darmstadt, Germany); Gianluigi Arduini (CERN, Geneva, Switzerland); Juliana Pranke (ESS, Lund, Sweden); Mike Seidel (PSI, Villigen, Switzerland); Mats Lindroos (ESS, Lund, Sweden) |
| ISBN |
978-3-95450-182-3 |
| Published |
May 2017 |
| Copyright |
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