| Title |
Single Photoemitter Tips in a DC Gun: Limiting Aberration-induced Emittance |
| Authors |
- I.V. Bazarov, L. Cultrera, C.M. Gulliford, H. Leepresenter
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
- H.K. Fung
Cornell University, Ithaca, New York, USA
- J.M. Maxson
UCLA, Los Angeles, California, USA
|
| Abstract |
Ultrafast electron diffraction (UED) offers unique advantages over x-ray diffraction, like stronger scattering cross-section, versatility in sample types and ability to offer smaller apparatus foot print. There is a growing need to increase brightness of electron beams especially for single-shot UED applications. We explore the utilization of field enhancement from a micron-scale single tip inside a DC gun to obtain brighter sub-pC electron beams using a nominal cathode electric field of several MV/m. The additional field enhancement can place moderate voltage sources on par with the highest gradient devices and allow improved performance presently not possible in the existing photoemission guns.
|
| Paper |
download TUPAB128.PDF [0.695 MB / 4 pages] |
| Export |
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| Conference |
IPAC2017, Copenhagen, Denmark |
| Series |
International Particle Accelerator Conference (8th) |
| Proceedings |
Link to full IPAC2017 Proccedings |
| Session |
Posters Tuesday 1 |
| Date |
16-May-17 16:00–18:00 |
| Main Classification |
02 Photon Sources and Electron Accelerators |
| Sub Classification |
T02 Electron Sources |
| Keywords |
emittance, electron, cathode, laser, cryogenics |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Volker RW Schaa (GSI, Darmstadt, Germany); Gianluigi Arduini (CERN, Geneva, Switzerland); Juliana Pranke (ESS, Lund, Sweden); Mike Seidel (PSI, Villigen, Switzerland); Mats Lindroos (ESS, Lund, Sweden) |
| ISBN |
978-3-95450-182-3 |
| Published |
May 2017 |
| Copyright |
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