| Title |
Characterization of the THz Radiation-Based Bunch Length Measurement System for the NSRRC Photoinjector |
| Authors |
- C.C. Liang, B.Y. Chen, C.H. Chenpresenter, M.C. Chou, S. Fann, C.S. Huang, N.Y. Huang, J.-Y. Hwang, W.K. Lau, A.P. Lee, T.Y. Lee, W.Y. Lin, T.-C. Yu
NSRRC, Hsinchu, Taiwan
|
| Abstract |
A part of high brightness photo-injection (HBI) project at NSRRC is intending to adopt Coherent Transition Radiation (CTR) and Coherent Undulator Radiation (CUR) to generate THz radiation with an ultrashort electron bunch. Such high intensity THz sources allow the THz spectrum to be conducted easily with a THz interferometer and a Golay cell detector. Furthermore, the radiation spectrum carries information of the electron distribution which allows ultrashort electron bunch length measurements. For verifying correct measuring procedure during the CTR and CUR experiments, a conventional THz radiation generated by optical rectification from a ZnTe crystal has been performed. The produced THz pulse was sent into a Michelson interferometer which is designed for the autocorrelation of the intense, sub-mm and mm-wavelength, spatially-coherent radiation pulses. The THz spectrum can be further obtained from the interferogram by the Fourier transform process. In such way, the THz spectrum can be investigated if the result is satisfactory and can be applied on the THz CTR and CUR experiments for the next step.
|
| Paper |
download THPAB149.PDF [2.146 MB / 3 pages] |
| Export |
download ※ BibTeX
※ LaTeX
※ Text/Word
※ RIS
※ EndNote |
| Conference |
IPAC2017, Copenhagen, Denmark |
| Series |
International Particle Accelerator Conference (8th) |
| Proceedings |
Link to full IPAC2017 Proccedings |
| Session |
Posters Thursday 1 |
| Date |
18-May-17 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T33 Online Modelling and Software Tools |
| Keywords |
radiation, laser, electron, detector, software |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Volker RW Schaa (GSI, Darmstadt, Germany); Gianluigi Arduini (CERN, Geneva, Switzerland); Juliana Pranke (ESS, Lund, Sweden); Mike Seidel (PSI, Villigen, Switzerland); Mats Lindroos (ESS, Lund, Sweden) |
| ISBN |
978-3-95450-182-3 |
| Published |
May 2017 |
| Copyright |
|