| Title |
Techniques for Transparent Lattice Measurement and Correction |
| Authors |
- W.X. Cheng, K. Ha, Y. Li
BNL, Upton, Long Island, New York, USA
|
| Abstract |
NSLS-II storage ring started top off operation since Oct 2015. It has been noticed during the user operation that machine lattice was affected by insertion devices (ID). The storage ring coupling, emittance and lifetime vary when ID gap changes. Lattice characterization was typically carried out with dedicated machine study time with low storage current. Due to collective effect, the lattice at high operation current is different. To characterize the machine lattice during normal user operation with little disturbance, a small portion of beam (~1%) filled in the ion gap can be excited by the bunch by bunch feedback system near betatron frequency. Recent development on BPM electronics enables the gate function to detect partial beam motion in the ring. With the gated BPM turn by turn data from excited bunches, storage ring lattice can be measured and corrected with the well-developed tools. We present in the paper preliminary test results with these tools to characterize the lattice and how it improves the machine performance during user operation.
|
| Funding |
Work supported by DOE contract No: DE-SC0012704 |
| Paper |
download MOPAB151.PDF [0.555 MB / 4 pages] |
| Export |
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※ EndNote |
| Conference |
IPAC2017, Copenhagen, Denmark |
| Series |
International Particle Accelerator Conference (8th) |
| Proceedings |
Link to full IPAC2017 Proccedings |
| Session |
Posters Monday 1 |
| Date |
15-May-17 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
lattice, feedback, operation, betatron, storage-ring |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Volker RW Schaa (GSI, Darmstadt, Germany); Gianluigi Arduini (CERN, Geneva, Switzerland); Juliana Pranke (ESS, Lund, Sweden); Mike Seidel (PSI, Villigen, Switzerland); Mats Lindroos (ESS, Lund, Sweden) |
| ISBN |
978-3-95450-182-3 |
| Published |
May 2017 |
| Copyright |
|
