| Title |
Residual-Gas Beam Profile Monitors for Intense Beams in Transfer Lines |
| Authors |
- R.J. Abrams, M.A. Cummings, V.G. Dudnikov, R.P. Johnson
Muons, Inc, Illinois, USA
- M. Popovic
Fermilab, Batavia, Illinois, USA
|
| Abstract |
Muons, Inc. proposes to develop a Residual-Gas Beam Profile Monitor for Transfer Lines with pulse-to-pulse precision of better than 0.1 mm in position and size that will operate over a wide range of proton beam intensities including those needed for multi-MW beams of future facilities. Traditional solid-based beam intercepting instrumentation produces unallowable levels of radiation at high powers. Our alternative approach is to use a low mass residual-gas profile monitor, where ionization electrons are collected along extended magnetic field lines and the gas composition and pressure in the beam pipe are locally controlled to minimize unwanted radiation and to improve resolution. Beam Induced Fluorescence profile monitor with mirascope light collection is proposed.
|
| Paper |
download MOPAB144.PDF [0.436 MB / 4 pages] |
| Export |
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| Conference |
IPAC2017, Copenhagen, Denmark |
| Series |
International Particle Accelerator Conference (8th) |
| Proceedings |
Link to full IPAC2017 Proccedings |
| Session |
Posters Monday 1 |
| Date |
15-May-17 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
electron, ion, proton, synchrotron, detector |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Volker RW Schaa (GSI, Darmstadt, Germany); Gianluigi Arduini (CERN, Geneva, Switzerland); Juliana Pranke (ESS, Lund, Sweden); Mike Seidel (PSI, Villigen, Switzerland); Mats Lindroos (ESS, Lund, Sweden) |
| ISBN |
978-3-95450-182-3 |
| Published |
May 2017 |
| Copyright |
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