| Title |
A Fast Beam Size Diagnostic System Using High-Speed Photomultiplier Array at SSRF |
| Authors |
- H.J. Chen, N. Zhangpresenter
SSRF, Shanghai, People's Republic of China
- J. Chen, B. Gao, L.W. Lai, Y.B. Leng
SINAP, Shanghai, People's Republic of China
|
| Abstract |
A fast beam size diagnostic system is developing at SSRF (Shanghai Synchrotron Radiation Facility) storage ring for turn-by-turn and bunch-by-bunch beam trans-verse oscillation study and fast transverse feedback sys-tem improvement. The system is based on visible synchrotron radiation diagnostic, detected by a Hamamatsu H10515B 16-channel photomultiplier array with 0.6ns rise time. A telescope imaging system is also developing for optical front-end process, with simulation optical path calibra-tion and high-resolution CCD camera reference. A fast pick-up board and amplifiers are designed for analogue signal optimization. The data acquisition and analyse solution is Tektronix oscilloscope with 6GHz analogue bandwidth and 25GS/s sampling rate or four synchronized ADQ14 digitizers with 700MHz analogue bandwidth and 1GS/s sampling rate. By now, we have finished the detector selection, sys-tem setup, data acquisition design and system response testing. The telescope imaging testing and 16-channels data acquisition based on synchronized ADQ14s are under development. A new photomultiplier array with less response time is in plan for strictly bunch-by-bunch diagnostic.
|
| Paper |
download MOPAB094.PDF [1.035 MB / 4 pages] |
| Export |
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| Conference |
IPAC2017, Copenhagen, Denmark |
| Series |
International Particle Accelerator Conference (8th) |
| Proceedings |
Link to full IPAC2017 Proccedings |
| Session |
Posters Monday 1 |
| Date |
15-May-17 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
diagnostics, pick-up, detector, storage-ring, synchrotron |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Volker RW Schaa (GSI, Darmstadt, Germany); Gianluigi Arduini (CERN, Geneva, Switzerland); Juliana Pranke (ESS, Lund, Sweden); Mike Seidel (PSI, Villigen, Switzerland); Mats Lindroos (ESS, Lund, Sweden) |
| ISBN |
978-3-95450-182-3 |
| Published |
May 2017 |
| Copyright |
|
