| Title |
Intensity Interferometer to Measure Bunch Length at SPEAR3 |
| Authors |
- W.J. Corbett
SLAC, Menlo Park, California, USA
- T.M. Mitsuhashi
KEK, Ibaraki, Japan
|
| Abstract |
Electron bunch length in a storage ring is typically measured with streak cameras, electro-optic devices or non-linear cross-correlation techniques with a range of system complexity, signal-to-noise ratios and cost. Another straight-forward method is to construct an 'intensity interferometer' utilizing a coincidence detector to record simultaneous photon arrival events. In this configuration, visible SR light is passed through a narrow bandpass filter followed by a small pinhole to generate a stream of single-mode monochromatic wavepackets. As the interferometer delay is scanned across an electron bunch, two-photon events occurring within the longitudinal coherence time of the light cause a reduction in the measured coincidence rate. The resulting autocorrelation of the optical pulse duration reveals the electron bunch length, independent of synchrotron oscillation motion. In this paper we comment on the theory and report on preliminary measurements carried out at SPEAR3.
|
| Paper |
download MOOCB3.PDF [0.452 MB / 4 pages] |
| Slides |
download MOOCB3_TALK.PDF [2.606 MB] |
| Export |
download ※ BibTeX
※ LaTeX
※ Text/Word
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※ EndNote |
| Conference |
IPAC2017, Copenhagen, Denmark |
| Series |
International Particle Accelerator Conference (8th) |
| Proceedings |
Link to full IPAC2017 Proccedings |
| Session |
Contributed Oral Presentations, Beam Instrumentation, Controls, Feedback & Oper. |
| Date |
15-May-17 15:00–16:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
photon, detector, optics, electron, storage-ring |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Volker RW Schaa (GSI, Darmstadt, Germany); Gianluigi Arduini (CERN, Geneva, Switzerland); Juliana Pranke (ESS, Lund, Sweden); Mike Seidel (PSI, Villigen, Switzerland); Mats Lindroos (ESS, Lund, Sweden) |
| ISBN |
978-3-95450-182-3 |
| Published |
May 2017 |
| Copyright |
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