| Title |
Improved N-Doping Protocols for SRF Cavities |
| Authors |
- D. Gonnella, R.G. Eichhorn, F. Furuta, G.M. Ge, T. Gruber, G.H. Hoffstaetter, J.J. Kaufman, P.N. Koufalispresenter, M. Liepe, J.T. Maniscalco
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
|
| Abstract |
Nitrogen-doping has been shown to consistently produce better quality factors in SRF cavities than is achievable with standard preparation techniques. Unfortunately, nitrogen-doping typically brings with it lower quench fields and higher sensitivities of residual resistance to trapped magnetic flux. Here we present work to understand these effects in hopes of mitigating them while maintaining the high Q desired by future projects. Using a nitrogen diffusion simulation, material parameters of nitrogen-doped cavities can be predicted prior to doping. These simulations results are consistent with SIMS data taken from samples treated with cavities. The nature of doping's effect on quench field has also been studied using CW and pulsed measurements. These results have allowed us to better understand the nature of nitrogen-doping and its effect on cavity performance.
|
| Funding |
NSF, DOE |
| Paper |
download WEPMR025.PDF [1.124 MB / 4 pages] |
| Export |
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| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Poster Session |
| Date |
11-May-16 16:00–18:00 |
| Main Classification |
07 Accelerator Technology |
| Sub Classification |
T07 Superconducting RF |
| Keywords |
simulation, cavity, niobium, SRF, radio-frequency |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
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