| Title |
Current Status of HES (Hard X-ray EndStation)-2 Beamline at PAL-XFEL |
| Authors |
- S. Kim, B. Kim, K.H. Nampresenter, J. Park
PAL, Pohang, Republic of Korea
|
| Abstract |
HES (Hard X-ray EndStation)-2 beamline is located at the hard X-ray experimental hall at PAL-XFEL. The main objective of HES-2 beamline is to deliver a hard X-ray FEL beam to target materials in such a manner that a coherent diffraction study is possible. This endstation is supposed to provide brilliant hard x-rays and to measure the diffraction patterns with forward scattering geometry. In particular, the instruments are designed for serial femtosecond X-ray crystallography (SFX) and coherent diffraction imaging (CDI). In this poster, we introduce HES-2 beamline at PAL-XFEL in terms of two perspectives: beamline instrumentation and sample environment. In the instrumentation part, the current status of HES-2 beamline is described in details. This includes beamline layout, x-ray optics, beam diagnositics and the upcoming commissioning plan for HES-2 beamline. In the sample environment part, we aim to present scientific goals based on the sample environments for CXI and SFX respectively. Finally, we discuss the feasible demo-experiments, which is expected to be done in 2016.
|
| Paper |
download THPOY052.PDF [3.007 MB / 3 pages] |
| Export |
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| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Poster Session |
| Date |
12-May-16 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T26 Photon Beam Lines and Components |
| Keywords |
detector, focusing, laser, optics, diagnostics |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
|
