| Title |
Time Response of a Gridded X-ray Beam Ionization Chamber |
| Authors |
- Y.H. Xu, Z.H. Sun
DongHua University, Songjiang, People's Republic of China
- D.V. Campen, W.J. Corbett
SLAC, Menlo Park, California, USA
- C.L. Li
East China University of Science and Technology, Shanghai, People's Republic of China
- W.J. Zhang
University of Saskatchewan, Saskatoon, Canada
|
| Abstract |
Recently, Quick-Scanning Extended X-ray Absorption Spectroscopy (QEXAS) has become an important tool for in-situ characterization of materials and measurement of associated electronic structure. In this case the time response of the ionization chamber affects the measurement resolution and therefore overall performance of the QEXAS system. Common parallel-plate ionization chambers have a step-response rise time of about 0.1 sec, which does not meet the requirements of QEXAS. To speed up the response, we constructed a gridded ionization chamber with variable bias voltage and optional background gas (N2 or He, respectively). To characterize the system we used a high-frequency beam chopper upstream of the ionization chamber and a high-speed, low-noise preamplifier to measure the step response of the chamber as a function of bias voltage and background gas conditions.
|
| Paper |
download THPOY050.PDF [1.627 MB / 3 pages] |
| Export |
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| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Poster Session |
| Date |
12-May-16 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T26 Photon Beam Lines and Components |
| Keywords |
ion, electron, experiment, radiation, photon |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
|
