| Title |
Graphene Coating for the Reduction of the Secondary Electron Yield |
| Authors |
- B.S. Sian, G.X. Xia, G.L. Yu
UMAN, Manchester, United Kingdom
- I. Kinloch, L. Lin, V. Valles
University of Manchester, Manchester, United Kingdom
- O.B. Malyshev, R. Valizadehpresenter
STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
- O.B. Malyshev, R. Valizadehpresenter, G.X. Xia
Cockcroft Institute, Warrington, Cheshire, United Kingdom
|
| Abstract |
Secondary electron emission is a limiting factor for a performance of many instruments ranging from small gauges and detectors to waveguides and charged particle accelerators. There have been several methods of reducing this effect, e.g. the method of using a material with a low Secondary Electron Yield (SEY) or thin film coating with such a low SEY material. This paper describes the effect of SEY mitigation with graphene coatings on aluminium substrate. The maximum SEY (dmax) was decreased from 2.4 for bare aluminium to 1.4 with a graphene coating. Measurements were taken using an electron gun and a Faraday cup, the electron energies varied between 80 eV and 1 keV with a bias of -18 V on the sample. Other biases of -3, -5, -9, -25, -50 and -75 V were also tested however there was no effect on the SEY.
|
| Paper |
download THPMY016.PDF [0.802 MB / 3 pages] |
| Export |
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| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Poster Session |
| Date |
12-May-16 16:00–18:00 |
| Main Classification |
07 Accelerator Technology |
| Sub Classification |
T14 Vacuum Technology |
| Keywords |
electron, cavity, vacuum, proton, framework |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
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