| Title |
Ultrafast Electron Microscopy using 100 Femtosecond Relativistic-Energy Electron Beam |
| Authors |
- J. Yang, K. Kan, K. Tanimura, Y. Yoshida
ISIR, Osaka, Japan
- J. Urakawa
KEK, Ibaraki, Japan
|
| Abstract |
An ultrafast detection technique on 100 fs time scales over sub-nanometer (even atomic) spatial dimensions has long been a goal for the scientists to reveal and understand the ultrafast structural-change induced dynamics in materials. In this paper, the generation of femtosecond electron pulses using the RF gun and the first prototype of femtosecond time-resolved relativistic-energy ultrafast electron microscopy (UEM) are reported. Finally, both relativistic-energy electron diffraction and image measurements in the UEM prototype are presented.
|
| Paper |
download THOAB03.PDF [0.727 MB / 3 pages] |
| Export |
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| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Contributed Oral Presentations, Applications of Accelerators |
| Date |
12-May-16 09:30–10:30 |
| Main Classification |
08 Applications of Accelerators |
| Sub Classification |
U02 Materials Analysis and Modification |
| Keywords |
electron, emittance, gun, brightness, laser |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
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