| Title |
Local Impedance Measurements at ALBA from Turn-by-Turn Acquisition |
| Authors |
- M. Carlà, G. Benedetti, T.F.G. Günzel, U. Irisopresenter, Z. Martí
ALBA-CELLS Synchrotron, Cerdanyola del Vallès, Spain
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| Abstract |
A transverse impedance source manifests itself, among other ways, by producing a small defocusing kick which depends on the beam bunch charge. By repeating optics measurements for different bunch charges, it is possible to disentangle the contribution produced by each impedance source from the dominating focusing effects given by the machine optics. But hunting for such faint defocusing effects poses strong requirements on the precision and sensibility of the measurements, and slow machine drifts or different thermal conditions shall be avoided. In this report, we present a novel method to assess in a fast and precise manner machine optics for different bunch charges using BPM turn-by-turn data and hybrid filling patterns. Finally, measurements for different ALBA machine components like scrapers and In-vacuum undulators are compared with simulation results.
|
| Paper |
download MOPOR007.PDF [0.203 MB / 4 pages] |
| Export |
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| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Poster Session |
| Date |
09-May-16 16:00–18:00 |
| Main Classification |
05 Beam Dynamics and Electromagnetic Fields |
| Sub Classification |
D04 Beam Coupling Impedance - Theory, Simulations, Measurements, Code Developments |
| Keywords |
impedance, insertion, lattice, vacuum, optics |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
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