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DOI:10.18429/JACoW-IPAC2016-MOPMR052
Title Single-shot Bunch-by-Bunch Horizontal Beam Size Measurements using a Gated Camera at CesrTA
Authors
  • S. Wang
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
  • R. Holtzapple
    CalPoly, San Luis Obispo, California, USA
Abstract A visible-light beam size monitor has been built and commissioned to measure transverse beam profiles at CESR-TA*. In order to eliminate beam jitter and to study bunch-by-bunch beam dynamics, a fast-gating camera has been utilized to measure single bunch transverse beam profiles. The minimum camera gate width is ~ 3ns which allows us to resolve single bunch beam dynamics along a CesrTA bunch train. Using single bunch interferometry at different bunch currents, we found that the horizontal beam sizes measured by gated camera are consistently less than those measured by a conventional CCD camera, demonstrating the elimination of turn-by-turn beam jitter with single shot capability. By stepping the camera trigger delay, we collected transverse beam profile images from each bunch in a 14ns-spacing 30-bunch train. The horizontal motion of each bunch as well as the horizontal beam size increases dramatically along an electron train but not along positron bunch trains under the same machine condition. The difference in single bunch horizontal dynamics may be a signature for the difference between electron cloud build-up for positron bunch trains versus ions present for electron bunch trains.
Footnotes & References * S.T. Wang, D.L. Rubin, J. Conway, M. Palmer, D. Hartill, R. Campbell, R. Holtzapple, NIMA, 703 (2013) 80
Funding Work supported by NSF NSF PHY-1416318, PHYS-1068662, PHYS-1535696
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Conference IPAC2016, Busan, Korea
Series International Particle Accelerator Conference (7th)
Proceedings Link to full IPAC2016 Proccedings
Session Poster Session
Date 09-May-16   16:00–18:00
Main Classification 06 Beam Instrumentation, Controls, Feedback and Operational Aspects
Sub Classification T03 Beam Diagnostics and Instrumentation
Keywords electron, positron, ion, vacuum, synchrotron-radiation
Publisher JACoW, Geneva, Switzerland
Editors Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-147-2
Published June 2016
Copyright
Copyright © 2016 by JACoW, Geneva, Switzerland     CC-BY Creative Commons License
cc Creative Commons Attribution 3.0