| Title |
Emittance Measurements and Operation Optimization for ECR Ion Sources |
| Authors |
- V. Tzoganis, C.P. Welschpresenter
The University of Liverpool, Liverpool, United Kingdom
- O. Kamigaito, T. Nagatomo, T. Nakagawa, V. Tzoganis
RIKEN Nishina Center, Wako, Japan
- V. Tzoganis, C.P. Welschpresenter
Cockcroft Institute, Warrington, Cheshire, United Kingdom
|
| Abstract |
Electron Cyclotron Resonance (ECR) ion sources supply a broad range of ions for post acceleration in cyclotrons. Here, an effort to improve the beam transfer from RIKEN's 18 GHz ECR ion source to the Low Energy Beam Transfer (LEBT) line and an optimization of the performance of the ion source is presented. Simulation studies have shown that less than 20% of the beam is currently transferred. The first goal is to measure the transverse beam emittance in real time. The emittance monitor designed and fabricated for this purpose utilizes a pepper pot plate followed by a transparent scintillator and a CMOS camera for image capture. The second goal is to find the optimal operating point of the ion source by sweeping parameters such as RF power, vacuum pressure, extraction electrode position and voltage. To this extent, modifications of the ion source took place, as well as a measurement of the magnetic field inside the ion source. In this contribution the results of the emittance and other operating parameters measurements, as well as the design details of the emittance monitor are presented
|
| Funding |
RIKEN IPA scheme and Cockcroft Institute Core Grant |
| Paper |
download MOPMR048.PDF [1.029 MB / 3 pages] |
| Export |
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| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Poster Session |
| Date |
09-May-16 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
ion, emittance, ion-source, ECR, cyclotron |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
|
