| Title |
Bunch Arrival Time Monitor Test at PAL-XFEL ITF |
| Authors |
- J.H. Hong, J.H. Hanpresenter, C. Kim, H. Yang
PAL, Pohang, Kyungbuk, Republic of Korea
|
| Abstract |
Femtosecond resolution electron bunch arrival time monitor (BAM) will be required for the beam-based RF phase feedback during PAL-XFEL operation. Two S-band cavity-type BAMs were manufactured for the test at the PAL-XFEL injector test facility (ITF). The resonance frequencies of the cavities are 2856 MHz and 2826.25 MHz. Electron beam induced signal from the cavities was digitized using a low level RF (LLRF) module. In this paper, the resolution of these cavities are analyzed and a possible improvement for better resolution are discussed.
|
| Paper |
download MOPMB058.PDF [1.493 MB / 3 pages] |
| Export |
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| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Poster Session |
| Date |
09-May-16 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
pick-up, LLRF, cavity, simulation, resonance |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
|
