| Title |
A High Sensitivity Faraday Cup for Ultrashort Electron Bunches |
| Authors |
- S. Setiniyaz, I.H. Baek, B.A. Gudkov, B. Han, K.H. Jang, Y.U. Jeong, H.W. Kim, S.V. Miginsky, J.H. Nam, S. Park, N. Vinokurov
KAERI, Daejon, Republic of Korea
- S.V. Miginsky, N. Vinokurov
BINP SB RAS, Novosibirsk, Russia
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| Abstract |
The UED (Ultrafast Electron Diffraction) beamline of KAERI (Korea Atomic Energy Research Institute) WCI (World Class Institute) Center has been successfully commissioned. A S-band co-axial RF photogun with 1.5 cylindrically symmetric cells was used to remove multiple modes of the electric filed inside the cavity. It is designed to generate sub-picosecond electron bunches with energy up to 3.3~MeV. We have developed a system consists of an in-air Faraday cup (FC) and a preamplifier for charge measurement. Tests performed utilizing 3.3~MeV electrons show the system were able to measure ultrashort bunches with tens of femtosecond pulse duration at 10 fC sensitivity. In this paper, we shall present the design, calibration and test results of this system.
|
| Paper |
download MOPMB054.PDF [1.243 MB / 3 pages] |
| Export |
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| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Poster Session |
| Date |
09-May-16 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
electron, simulation, gun, laser, experiment |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
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