| Title |
Beam Profile Measurement Using Kirkpatrick Baez Mirror Optics at Shanghai Synchrotron Radiation Facility |
| Authors |
- D.C. Zhu, J.S. Cao, Y.F. Sui, J.H. Yue
IHEP, Beijing, People's Republic of China
- J. Chen
SINAP, Shanghai, People's Republic of China
|
| Abstract |
For the third-generation light sources, the vertical emit-tance of a few pico-meter-radians which can be achieved with good coupling correction close to 0.1%, will lead to very small beam size. Several microns vertical beam sizes measurement has presented challenges for diagnostic capability in this region. A few techniques have been developed to make a precise measurement, such as visible light interferometer, x-ray imaging using Fresnel zone plates, compound refractive lenses or pinhole camera. In this paper, an x-ray reflective optics method based on the Kirkpatrick'Baez mirrors will be emphasis on discussed. The K-B mirror system will be installed and tested in SSRF to obtain the vertical beam size close to 20 microns, which is expected to be used for several microns vertical beam size measurement in the future light source named HEPS (High Energy Photon Source) in China.
|
| Paper |
download MOPMB036.PDF [0.598 MB / 4 pages] |
| Export |
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| Conference |
IPAC2016, Busan, Korea |
| Series |
International Particle Accelerator Conference (7th) |
| Proceedings |
Link to full IPAC2016 Proccedings |
| Session |
Poster Session |
| Date |
09-May-16 16:00–18:00 |
| Main Classification |
06 Beam Instrumentation, Controls, Feedback and Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
synchrotron, radiation, synchrotron-radiation, optics, diagnostics |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-147-2 |
| Published |
June 2016 |
| Copyright |
|
